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I didn't realize before, but my system isn't setup with Peak Force capabilities. So I am trying to gather Force Volume data instead, but I have some early setbacks. The tip is false engaging and I've tried the countermeasures outlined in the manual (adjusting the photodiode alignment) Is there any other recommendations you can make to help
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Alternatively, would Peak Force Tapping provide similar data more quickly?
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Hello, I am new to AFM and am trying to collect some mechanical property information on a sample of photoresist (has been developed, hardened) I have a supply of SNL-10 probes which I believe would suit my needs for contact mode Force Imaging/Force Volume measurements. This may be a silly question, but I don't know what precautions I need to take
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Hello, I have a wafer sample with patterned PR wanting to topographically profile some high aspect ratio trenches. I have a FIB1-100 tip loaded into my dimension icon system. I have decent surface tracking except that what should be rectangular appear rounded at the island and seam-like in the trench. It's as if the tip is not getting into the trench