The Nanoscale World

Search

  • Re: Question regarding tip convolution

    Hi Corey, you may try to estimate the problem with the tip deconvolution software: http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software Some of the methods include "blind" deconvolution and will give the "correct" particle shapes without calibration substrate. To my memory, the NanoScope Analysis has
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Wed, Jun 18 2014
  • Re: NanoScope IIIa X-Y Board problem

    Hi Peter, here is the list of NanoScope repairers: http://confocal-manawatu.pbworks.com/w/page/69124694/NanoScope%20AFM%20Repairs They may have what you are after. Cheers, Dimitri
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Mon, May 19 2014
  • MultiMode Tapping Mode Tuning Problem

    Dear All, I am trying to revive the MultiMode IIIa in Tapping Mode with a little success. The Auto Tune doesn't work. It says "Drive amplitude could not be made small enough to attain target amplitude. Either an overly sensitive cantilere is being used or the Nanoscope electronics are miscalibrated." I've tried: changed cantilever
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Tue, Jul 23 2013
  • Re: Accuracy of calibration grids

    Hi Alessandro, I would be grateful for sharing that information with me too. In the meantime, you could try the autocorrelation of your sample by shifting it along one of the axis and measuring the errors produced by the instrument. That will give you an idea on the accuracy of your instrument as well as the accurate measurements of your samples. With
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Thu, Jun 6 2013
  • Re: Exporting 2D images with the cross section lines included

    Hi there, would you like to drop me one of your files for trial and the version of the software you are on? I will start with NanoScope Analysis: http://confocal-manawatu.pbworks.com/w/page/42081029/NanoScope%20Analysis%20Download Cheers, Dmitry http://confocal-manawatu.pbworks.com/w/page/23665663/Dmitry%20Sokolov
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Sat, Apr 6 2013
  • Re: Repeating pattern in contact mode

    Hi Solong, what you show is "normal" for contact mode CAFM with the metal coated probes. Melted coating means that your setup has no voltage control based on the feedback from current and/or temperature. That is also rising the question on the reproducibility of the measurements at the unstable probing conditions and the mechanisms of the
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Thu, Apr 4 2013
  • Re: Co2 Snow Cleaning

    Hi Olly, I did not try myself but I don't see why it would not work with the sample fixed properly. Vacuum chuck (from a spin coater) should be helpful: http://confocal-manawatu.pbworks.com/w/page/63714895/Vacuum%20Chuck%20for%20Spin%20Coaters Please tell me how it worked. Cheers, Dmitry
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Sun, Feb 17 2013
  • Re: Force data analysis software

    Hi Qianhuang, Here is the MIAWiki permalink to what you are after: http://confocal-manawatu.pbworks.com/w/page/42081029/NanoScope%20Analysis%20Download Cheers, Dmitry
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Thu, Feb 14 2013
  • Re: Innova AFM laser alignment

    It can be laser misalignment, strong interaction of the probe with the surface, maybe something else. I could take a look if you decide to share your screen with me or chat via Skype: FalconDot. Cheers, Dmitry MIAWiki Knowledge Network
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Sun, Feb 3 2013
  • Re: Water purity and nanoparticles on Mica

    Hi Don, I would agree with Peter. DLS will help to exclude either water or the nitrogen as the source of contamination. Rinsing of the sample facing a sink or rubbish bin followed by the careful drying either in air or on the hot plate under a Petri dish should work well. "Air gun" with "clean" gas can be a source of contamination
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Fri, Jan 25 2013
Page 1 of 4 (34 items) 1 2 3 4 Next > | More Search Options
Copyright (c) 2011 Bruker Instruments