The Nanoscale World

Search

  • Re: CAFM

    Hi Benjamin, I believe the purpose of 10 MOhm resistor is to restrict the current flowing through the tip-sample gap. The breakdown of the gap however depends not on the electric current but on the field in the gap and can take place at very low voltages. If you do calculations of the current densities through the gap that will most probably show the
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Tue, Oct 18 2011
  • Re: Caliber in vacuum?

    Hi Harman, It looks like your experiment will rely on the humidity of the nitrogen from a “can” or a line. The excessive pressure setup however will allow blowing the nitrogen away through the slits and the pores of your environmental chamber compared to the vacuum allowing the air from the room leaking into. The environmental chamber for
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Thu, Sep 29 2011
  • Re: TUNA on oxides?

    Hi Stefan, Thank you for your comments. I am just putting the general consideration to the reproducibility of the measurements with conductive probes. In some of my experiments I was able to restore the metal layer on the tip by applying higher bias voltage for a couple of seconds. The probe after these experiments was absolutely warn out as seen under
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Mon, Sep 26 2011
  • Re: Diamond conductive tips DDESP ageing problem

    Hi Peiman, please consider the built-in voltage of the probe - sample junction that may affect your electric measurements. That may explain IV curve shift from 0V for example. The modification of the surface (both oxidation in air and roughness increase) at pre-acquisition scanning can be a major problem too. Try to mimimize the cantilever load at imaging
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Mon, Sep 26 2011
  • Re: Diamond conductive tips DDESP ageing problem

    Would you be able to examine the tips with SEM or tip calibration gratings? Could it also be a bad contact of the chip with probe holder? Cheers, Dmitry MIAWiki
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Sun, Sep 25 2011
  • Re: TUNA on oxides?

    I would just add my 20 cents to the answer from Stefan. Tip shape can be changed any time under following factors: initial shape, how sharp the tip is combination material/coating of the probe bias voltage (1V can already be high enough to modify a coating of a sharp probe) load on the probe (matter of rigidity of the probe) scanning mode for imaging
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Fri, Sep 23 2011
  • Re: TUNA on oxides?

    I would just add my 20 cents to the answer from Stefan. Tip shape can be changed any time under following factors: initial shape, how sharp the tip is combination material/coating of the probe bias voltage (1V can already be high enough to modify a coating of a sharp probe) load on the probe (matter of rigidity of the probe) scanning mode for imaging
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Fri, Sep 23 2011
  • Re: Volume measurements

    Nuclei Volume Estimation: http://confocal-manawatu.pbworks.com/w/page/16346886/Confocal%20Measurements%20Lab%20ImageJ
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Tue, Aug 23 2011
  • Re: Volume measurements

    Permalink to AFM Deconvolution Software at MIAWiki: http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software Cheers, Dmitry
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Tue, Aug 23 2011
  • Re: Tip Deconvolution Software

    Thank you Steve, I'll try Dwydion. The permalink on the topic at MIAWiki: http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software Thanks again, Dmitry
    Posted to SPM Digest (Forum) by Dmitry Sokolov on Fri, Aug 5 2011
Page 3 of 4 (34 items) < Previous 1 2 3 4 Next > | More Search Options
Copyright (c) 2011 Bruker Instruments