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Hi Ang, I had a similar problem. Would sending you the point and shoot images be enough for you to determine what parameters possibly need to be changed? I was ramping from -5 to +5V. How can I save the ramp files settings to send along? Mithun
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Hi Stephen, I have a few similar queries and a request. Request : Could you please send me "practical advice to determine the spring constants of AFM cantilevers" the app note? Queries: 1. Can you provide a table for AFM tip - indentation depth on Ti tip check sample for the probes that Bruker has? I am not able to decide what indentation
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Thanks Bede. That was very helpful. Now we do not have PFQNM but would talk to Jay Anederson to inquire about the pricing etc. because - 1. the noise is quite irritating and defeats the purpose of the efficacy of the scans. 2. I am not certain of the acceptability of the X /Y lock in outputs in the scientific community as they do not appear to be tangible
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Bede, Would you suggest turning the scanasyst auto control to individual and then decreasing the set point? As there seems to be appreciable noise as you pointed out, even in the Inphase window.
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Thanks Stefan. Since the cantilever is not being oscillated anymore, in this mode obviously there can be no phase difference. Why and how does the x and Y outputs of the lock ins still represent the compositional distribution within the scan area? Thanks for the link to the document. I am going through it.
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Thanks Bede. Is there any output in the QNM mode which is comparable to the phase imaging in tapping? What is the difference between Inphase and Quadrature outputs, in layman terms? Why does the quadrarture seem to have more noise? Could you elucidate which parameters should be modified in the scanassyst mode, if any? Is the Young's modulus derived
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I have a similar query... how can it be related to the phase images from the conventional imaging modes? Can it be utilized to replace the phase images, especially if one does not have the peak force mode on ICON and only have the scanassyst modes?
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Hi Chunzeng, I got the potential window by selecting potential in teh interleave window for feedback type. SO that problem has been solved, but the potential channel does not have anything other than sharp spikes (even at voltage as low as .002 V). Tried changing hte drive amplitude, the lift scan height, the bias, the gains etc. Nothing seemed to have
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Hi Chunzeng, I am unable to pull up the potential data type in the channel 2. We have a Quadrex extender with the MM and a Nanoscope IIIA controller. WHat should be the setting to get surface potential mapping. Can you send a screenshot of the operational window please? I have selected all the options on the interleave panel as suggested. Since I did
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Sheila, I would like to use the Multimode for measuring surface potential of conjugated polymeric systems like thiophenes and their blends. Are you studying organic materials as well? If so, do you think having the EFM HOLDER AND SCM-PIT tips would be enough to carry out the measurements? Or is it necessary to apply voltage externally to the sample