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  • Re: Export raw nanoscope data

    Hallo Juliane, sorry but I didn't try to get back the original raw data that was saved with offline planefit full. Just disabled planefit in future measurmenents...
    Posted to SPM Digest (Forum) by JFP on Wed, Oct 16 2013
  • Re: Dependence of deflection-sensitivity on ramp-size

    Hi Rachelle, I think it's caused by interference. May be it helps when you rotate or tilt your sample by a few degrees so that the light deflected from the sample surface doesn't hit the detector. Best regard Jonas
    Posted to SPM Digest (Forum) by JFP on Mon, Jan 7 2013
  • Re: image processing

    Hi Joop, thanks for your help. I checked if there is the same behavior on a calibration grid, but there is no bow in slow scan direction. Wouldn't one expect bad tracking rather in the fast scan direction than in the slow? best regards Jonas
    Posted to SPM Digest (Forum) by JFP on Tue, Apr 3 2012
  • Re: image processing

    Posted to SPM Digest (Forum) by JFP on Mon, Apr 2 2012
  • Re: image processing

    Hi Stefan, Thanks for your help. I don't think it's thermal drift, because it's not monotone and all images look alike. For example see the attached crosssections. Every image shows exactly this behavior but when it's because of thermal drift they should not, or? Best regards Jonas Scan angle 0° (red: slow, blue fast scan direction
    Posted to SPM Digest (Forum) by JFP on Mon, Apr 2 2012
  • image processing

    Hallo, I tried imaging a flat punch with multimode afm in contact and tapping mode. In principle it worked but I think there is a scanning artifact that I don't get rid of. Imaging with a scan angle of 0° and 90° respectively leads to inconsistent data. In both images there is a bow in the slow scan direction. In the fast scan direction
    Posted to SPM Digest (Forum) by JFP on Mon, Apr 2 2012
  • Re: Export raw nanoscope data

    ps: offline planefit = full
    Posted to SPM Digest (Forum) by JFP on Wed, Sep 28 2011
  • Re: Export raw nanoscope data

    Hi Bede, thanks for your help. I'm calculating friction force from lateral signal. You say its difficult to get raw data, so it's possible? Best regards Jonas
    Posted to SPM Digest (Forum) by JFP on Wed, Sep 28 2011
  • Export raw nanoscope data

    Hallo, is there a way to export raw nanoscope data with the nanoscope analysis software or even to display it? This is important for me because of calculating lateral forces. The only access to a raw data value I know is the "raw mean" in the roughness analysis... Thanks for your help. Best regards Jonas
    Posted to SPM Digest (Forum) by JFP on Fri, Sep 23 2011
  • Re: Dependence of deflection-sensitivity on ramp-size

    Hi Ben, you are right. I recorded a calibration grid with different z-limits and observed a change in height of about 20nm! The jump occurs between the z-limits 716nm and 717nm. I also observed a jump in deflection-sensitivity when recording force-distance-curves without trigger at a ramp-size of 716nm and 717nm. Is there a chance to fix this on my
    Posted to SPM Digest (Forum) by JFP on Tue, Sep 13 2011
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