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Thanks for the advice. I had more time to analyze our tips (TAP525A) comparing before and after measurements. I am significantly wearing the tips (radius 8nm->~100nm) and also building up sample debris. I do have DDESP (DLC coated) tips that are less sharp to also try but am not sure if they are suitable for my sample hardness. Any suggestion on
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Hi, I am new to QNM and am trying to measure the modulus of films (100's of nm thick on Si substrate) in the 5-10GPa range. (1) What kind of precision is expected for measurements calibrated to a reference and what procedure is recommend for comparing multiple samples ? I have been using the TAP525A tip, and noticed I am either getting tip contamination
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Thanks for the tip suggestion and comments. I will give the solid metal tips a try since the SCM-PIC tips I've been using become non-conductive quickly. Would the DDESP tips survive longer under the biases needed for breakdown -- leading to better reproducibility?
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I am new to electrical measurements on the AFM and have been recently used our TUNA module on oxides (10-100 Ang.) for investigating breakdown. I have two main questions for anyone who has experience with these measurements. (1) I've started to come to the conclusion that I am only able to perform relative (non quantitative) comparisons between