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can PFM studies be done using multimode V system? Is there any special software/hardware requirement in MM V AFM with NS V controller for the PFM studies?
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hello we are using Multimode V (NS V). Today while scanning in tapping mode elongated features appear in one direction as shown in image attached and this continued with the change in sample and even with tip. Later Scanner was also changed and same problem appeared. we are using v 730 version of software, also we have its previous version v720. In
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hi Soling I will try it again. can u plz send the image captured by you for thickness measurement. my mail id is sandeepsthakur1@yahoo.co.in Regards Sandeep
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hello I am trying to measure to measure thickness of thin film (rf sputtered) but not able to get good image with step. Half of the substrate was masked during deposition and a clear difference of deposited film and substrate can be seen through CCD. Please suggest me the way I can measure the thickness through AFM. Is there any special procedure for
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where and how tipless probes can be used????
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Dear Sir/madam can anyone tell how SCM data can be quantified??? If there is any literature giving information regarding quantification of SCM data..please share the link Thanks........ SAndeep
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hello John first of all thakyou very much for the response and sorry for late reply. As you suggested we tried for MFM in contact mode. we are using multimode V SPM, and while doing in contact mode there is no option for deflection. please let us know how it is possible to enable deflection channel. I asked the same question to the engineer of ICON
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hi solong Thanku very much for the response. yes you are absolutely right - contact mode maintains the constant deflection/force. This thing came in my mind because -- what !!! if we talk about about constant height rather than constant force? If we talk about any characterization involving 2 pass technique e.g. EFM or MFM tip is lifted to a certain
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hello We are using SPM multimode V. I have a query regarding data type in contact mode. we do not have option for selecting "Deflection" as data type. It is not displaying in the data type channel. I want to know how this option can be activated?
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Dear sir if we have certain probe with low spring constant (say~ 0.2 N/m) and low res freq (say ~10-15 KHz) with magnetic coatong (Co/Cr), then is it possible to do MFM using these probes as the spring constant and resonant freq matches to contact mode probes???? generally MFM is done in non-contact mode, is it possible to do MFM in contact mode also