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Bruker-axs.com | +1 520 741-1044 NANOVATIONS Newsletter Vol. 1 April 2012 BioScope Catalyst and new Software Tools Fuel Advances in Mechanobiology A key feature of AFM is its ability to interact mechanically with samples. This is central to some of the most common applications within biology and biophysics, which rather than focusing on the imaging
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Bruker-axs.com | +1 805 967-1400 NANOVATIONS Newsletter Vol. 1 April 2012 Bruker ECAFM Solutions Opening New Opportunities in Li Battery Research Turnkey Solutions Helping Advance Green Energy Research There continues to be great need and investment in advancing green energy research. Current regional turmoil, rising costs of fossil fuels and published
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January 2012, Issue 01 Call for Papers We are pleased to announce Seeing at the Nanoscale 2012, being held July 9th-11th, 2012, at the Wills Memorial Building, University of Bristol in the United Kingdom. This is the tenth annual scientific conference focusing on nanostructure imaging, characterization and modification using atomic force microscopy
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January 2012 PeakForce TUNA™ PeakForce TUNA™ is one of several recent Bruker atomic force microscopy (AFM) modes and measurement modules that transform AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. The PeakForce TUNA module enables very high-resolution nanoelectrical characterization on fragile
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January 2012 Advancing TERS Research through the Combination of Industry-Leading Atomic Force Microscopy & Raman Spectroscopy Also available: inVia / Catalyst-IRIS combined system for transparent samples (transmission geometry). Please contact Bruker or Renishaw for further details. Researchers no longer have to worry about the hassles involved
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January 2012 MultiMode 8 AFM with ScanAsyst-HR Delivers 6X Increase in Image Rate Bruker is pleased to introduce the MultiMode® 8 Atomic Force Microscope (AFM) with fast scanning capabilities. The system’s new ScanAsyst-HR feature provides a direct 6X increase in imaging rate for significantly improved research productivity. This remarkable
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January 2012 Customer Service Ensuring Unsurpassed Global Service – Bruker Nano Surfaces Division Opens New Customer Care Centers Bruker has a long history of providing the best service possible to its customers. Building upon this reputation, Bruker has made significant enhancements to its service solutions for its Nano Surfaces Division over
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January 2012 Publication Spotlight This publication spotlight highlights a paper published in the November 2011 issue of Measurement Science and Technology . It is titled “The use of the PeakForce quantitative nanomechanical mapping AFM-based method for high-resolution Young’s modulus measurement of polymers,” and is authored by a
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Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further
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Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks both at the complementary information gained from