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  • Re: Nanoscope analysis

    Hi Bede, Thank you for your reply. I am using the Nanoscope v5 to do force mapping. I reinstall the software again, now it could create a file now. I think something is wrong with the software before. Qian
    Posted to SPM Digest (Forum) by qianhuang on Mon, Oct 14 2013
  • Nanoscope analysis

    Hi Everyone, I am trying to extract force-indentation curve from force-mapping using the NanoScope_Analysis_v140r3sr5. I can creat a file for each force-curve, but it turns out to be blank. I am using 6313jnm scanner now. But previous I am using 8731EVLR scanner, I can extract the force curve and do some initial treatment to the force curve using Nanosope
    Posted to SPM Digest (Forum) by qianhuang on Fri, Oct 4 2013
  • Re: Testing mechanical properties with adhesion

    Thanks, janne!I have another question, because my polymer has thiol group on the end, and tip I am using has back side gold coating. Is it possible they would attract each other?
    Posted to SPM Digest (Forum) by qianhuang on Wed, Feb 20 2013
  • Testing mechanical properties with adhesion

    Hi everyone, Recently I am testing the mechanical properties of polymer in water, but it has small adhesion. During adhesion, the force is complex, including adhesion force, electrostatic force and repulsion btw tip and polymer. Because the indentation is small around 3-4nm, I really need to analysis the data clearly. So I wonder how can I get rid of
    Posted to SPM Digest (Forum) by qianhuang on Tue, Feb 19 2013
  • Force data analysis software

    Hi everyone, I am currently using Nanoscope IV controller to do force curve and using NanoScope_Analysis_v120b24. I think it is old version, and I find there is a new version of force spectroscopy data analysis 1.40R2. I find the link: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/2740.aspx. But I cannot download the software as described
    Posted to SPM Digest (Forum) by qianhuang on Thu, Feb 14 2013
  • Lateral force sensitivity

    Hello, I am trying to bend a nanowire using AFM tip to investigate its young's modulus. I find one paper said they fixed nanowire on one end and bend it on the other end using AFM tip. They measure the lateral force-distance curve. Now I know how to calibrate a normal force sensitivity, but I don't know how to calibrate a lateral force sensitivity
    Posted to SPM Digest (Forum) by qianhuang on Wed, Nov 28 2012
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