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  • problem in tuning of tapping mode cantilevers

    Dear Friends I have a Nanoscope IIIa Multimode AFM system with a signal access module and an extender box. Recently I have started facing a problem in tapping mode AFM. When i try to auto tune the AFM I get the following error message "Drive amplitude exceeded the safety limit while trying to attain the target amplitude. The tip may be broken or
    Posted to SPM Digest (Forum) by Deepak on Thu, Jun 15 2017
  • Re: CAFM current through signal access module

    Hi Peter We carried out CAFM based I-V measurements as suggested by you. The signal access module seems to be of the kind mentioned in point 2 of your post above We used the AUX D channel on the SAM while the I-V spectrum of HOPG was being acquired and connected the AUX D channel to the 6517 electrometer. From the I-V spectra being displayed on the
    Posted to SPM Digest (Forum) by Deepak on Thu, Oct 15 2015
  • CAFM current through signal access module

    I am carrying out CAFM measurements of thin film samples using nanoscope IIIa equipped with a signal access module. We are carrying out both current mapping imaging and local I-V measurements at one position. We want to access the current signal (during local I-V measurements) out from the signal access module. This is required for the noise measurements
    Posted to SPM Digest (Forum) by Deepak on Thu, Aug 20 2015
  • Re: mapping of various properties as a function of time

    Hi Peter I was able to get the value of friction as a function of time using the method of fake ramp suggested by you. thanks a lot Deepak
    Posted to SPM Digest (Forum) by Deepak on Wed, Jul 15 2015
  • Re: signal access module

    Hi Bede I am using Nanoscope IIIa. The signal access module is connected between the extender and the controller Deepak
    Posted to SPM Digest (Forum) by Deepak on Wed, Jul 15 2015
  • signal access module

    Hi Friends This is regarding using the signal access module with Nanoscope III a controller. I am interested in retrieving the friction data of a sample from the nanoscope through the signal access module. Is the above possible and if yes what are steps to be followed. I have been trying to read the SAM manual but am not able to understand it clearly
    Posted to SPM Digest (Forum) by Deepak on Fri, Jun 19 2015
  • Re: mapping of various properties as a function of time

    Hi Peter Thanks for the reply. I would like to clarify a few points regarding the method you have recommended: (1) I should go to the spectroscopy mode and keep the starting and ending ramp values the same. For example if I am ramping the voltage signal then starting and ending voltage value should be the same. (2) Thereafter I should keep the total
    Posted to SPM Digest (Forum) by Deepak on Fri, Jun 19 2015
  • Re: mapping of various properties as a function of time

    Hi Peter Thanks for the information We are using software version 5.31 r1 Deepak
    Posted to SPM Digest (Forum) by Deepak on Wed, Jun 10 2015
  • mapping of various properties as a function of time

    Hello friends I was interested in measuring the variation in various properties (deflection, friction, current, etc) as a function of time at a particular spot on the sample surface using Nanoscope IIIa. What is the most reliable way to do the above Thanks Deepak
    Posted to SPM Digest (Forum) by Deepak on Fri, Jun 5 2015
  • kelvin probe force microscopy

    I have some experience using KPFM in the two pass lift mode using Multimode (Nanoscope IIIa) AFM system. Is it possible to do KPFM in a single pass mode (frequency modulation) with this system. If yes, what steps need to be followed. thanks Deepak
    Posted to SPM Digest (Forum) by Deepak on Sun, Aug 25 2013
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