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I have a query regarding CAFM measurements. During these measurements we apply a bias between the tip and the sample. This must result in an electrostatic force on the cantilever. Can this force be quantified in some manner and does this lead to a modification of the loading force during the measurement. thanks Deepak
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I have tried using the previous calibration file, but the problem persists. Re-calibration is difficult as I am not able to image the grid. Is it possible that one of the piezo of the scanner has gone bad and is there some way to check this.
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I have tried using the previous calibration file, but the problem persists. Re-calibration is difficult as I am not able to image the grid. Is it possible that one of the piezo of the scanner has gone bad and is there some way to check this.
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We have been using Nanoscope IIIa instrument which has recently developed a problem. The e-scanner is not able to image the samples and the features appear to be stretched in one direction. I am attaching two images of the same sample, one taken with the e-scanner and another with the J-scanner. The stretching in E-scanner is evident. Any suggestions