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Bede, At one point you had mentioned did the deflection sensitivity change with use and it appears that it does. The deflection sensitivity changes through either increasing instrument use time or 2 degrees F temperature change. Whenever we calibrate the instrument and scan any given sample the deflection sensitivity decreases for a few hours then stabilizes
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Hi Bede, Is there any documentation for plasma cleaning procedures of the sapphire sample in terms of time and or conditions? Also, will the cleaning itself damage the adhesive used to bond the sapphire to the metal puck? Thanks
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I do not move the laser position once calibrated since the deflection sensitivity is a function of laser position on the cantilever. I calibrated (minus radius) the system and obtained a force curve on silica using a sharp tip. Same kind of bad results though there was no negative aspect to the curve. I will do what you've suggested regarding the
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I have used sapphire in the past, tried the fused silica, and recently moved to both to determine the deflection sensitivity. The cantilever spring constant is 5 N/m nominal. One issue that has cropped up recently, and why I started looking at the fsilica sample, is the sapphire sample has what I am assuming water build-up on the surface, which is not
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Normal 0 false false false EN-US X-NONE X-NONE Hi, We have a Multimode 8 and Nanoscope V controller with PFQNM. I have used PFQNM on polystyrene and blend samples in the PFQNM kit as well as on other polymers to obtain the correct elastic modulus value using DMT for mapping and force curves. One day the values were correct and the next day they were