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Hi, I am having an issue autotuning the cantilever. It tunes normally when the sample surface is in focus SP: 2.8V, Drive amplitude: 0.2V. After I engage the tip, since the images are not optimal, I changed the setpoint/gains etc to get a good image. After that didn't work, I tried to tune the cantilever again and it gives me an error "Automatic
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Hi Joop, Even after I put in the values for tip dia, spring constant etc, it still does not allow me to calculate the youngs modulus using the 'Nanoindentation' function. It gives me the same error: Error: Indentation analysis is only available for deflections channels that have deflection sensitivity and spring constant. I am not even able
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Hello, I would really appreciate it if someone could help me out with this. I am trying to measure the hardness of thin oxide films (~1 um) deposited on metal substrates and I am having a few issues: 1. I was initially using the PDNISP-HS probe to do this, since literature shows that samples similar to ours have hardness of ~5-20 GPa and young’s
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Stefan, If you see the voltage vs. z curves that I obtained, there seems to be some hysterisis (it forms a loop at the top). I have tried decreasing the trigger voltage down to 0.5 V and it still gives me a similar curve but not a good indentation. I would really appreciate it if you could send me the softer cantilevers. Could I please have your email
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I have been trying to make a few measurements but I am not getting the right force curves. The samples that I indented are alloy tapes (50 um thick). I used the following settings: Z linearizer on Z-relative on Closed loop Z Oscialltion off Ramp rate: 0.5 um/sec, 1 um/sec Z start: 0 um Z end: 5 um Trigger voltage: 5 V, 2V Could you please tell me what
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Thank you for the response Stefan. Initially, since I did not know whether the same probe could be used for imaging, I always swtiched to an OTESPA probe, to be safe. But the problem with switching the probe was finding the exact same spot for imaging. Since the cantilever lengths are different, I have to scan around to find the spot. I will measure
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Another question 6. I am using a PDNISP-HS probe. The calibration sheet that came with it said it has a frequency of 73 KHz and sensitivity of 198 nm/V. In order to check it with the Edge, I did a point spectroscopy on a <111> Si wafer to get the sensitivity (~128 nm/V). To calculate the spring constant, I used thermal tune, but looks like the
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Hi, I am trying to do nanoindentation on flat metal tapes with a Dimension Edge AFM using Point Spectroscopy. The main purpose of doing this is to measure the hardness of oxide films deposited on the metal tape. I have a PDNISP-HS probe. I understand that I first have to calibrate the sensitivity, and then do a thermal tune to calculate the spring constant