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  • Re: Moisture concerns for AFM measurements

    Dear Stefan, Tanks for your helpful advices. I will use conductive tapes from now on and I will stop drying my samples. Nevertheless, I wonder how to assure that what I measure is not just a moisture effect. I will store my samples under the same conditions; I hope that the effects are reduced that way. Best regards, Dietmar Haba
    Posted to SPM Digest (Forum) by Polis Tyrol on Wed, May 15 2013
  • Nanoscale Thermal Analysis / Transition Temperature Mapping

    Dear community, I am interested in measuring glass-transition temperature (Tg) distributions at the nanoscale. However, so far I don't know if there are indeed different transition temperatures in the material. For that reason, I would like to do some quick-and-dirty measurements to obtain Tg images without yet purchasing the Nanoscale Thermal Analysis
    Posted to SPM Digest (Forum) by Polis Tyrol on Wed, May 15 2013
  • Re: Moisture concerns for AFM measurements

    Dear Stefan, Now that is interesting. I didn't ever think of the significance of elecrostatic charging. This might become even worse by drying, right? My samples are nonconductive so I doubt that conductive sticky tapes might help. So far I use glue to fix my samples. But no, I do not use any Polonium source. What would that be for? I am even less
    Posted to SPM Digest (Forum) by Polis Tyrol on Wed, May 15 2013
  • Re: Threshold in ramping affects deflection sensitivity

    Dear Shiyue, This is a very simiar problem to http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/p/1411/3942.aspx#3942 . It would be interesting to know by how much the two deflection sensitivities differ from each other, which one of the two is higher and especially how high they are. What you need is a fairly linear curve; as long as you can
    Posted to SPM Digest (Forum) by Polis Tyrol on Tue, May 14 2013
  • Re: Variation in deflection sensitivity with all parameters constant

    Dear Mr. Karamath, The reproducibility of the deflection sensitivity should lie within 5% according to what I've been told by Bruker employees. This is approximately the case for the values you mention here. However, "10-20%" is clearly too much. If you use Peak Force QNM the measured modulus depends on the deflection sensitivity by the
    Posted to SPM Digest (Forum) by Polis Tyrol on Tue, May 14 2013
  • Moisture concerns for AFM measurements

    Dear community, I am working on plastic samples with stiffnesses around 2 GPa and use PeakForce QNM in air to analyze them at the nanoscale. Now I was wondering how important moisture concerns are for the correct interpretation of the measured data. So far, I keep my samples in a dry environment until I measure them; however, I have no idea whether
    Posted to SPM Digest (Forum) by Polis Tyrol on Mon, May 13 2013
  • Re: How to use Point and Shoot Method to Calculate Modulus in Live Cells using the Catalyst

    Hi, Bede, 1. I use version 1.40, Build R3Sr4 2. I did both as I saw that something was going wrong there. 3. I think this is what I did, yes. When you say you failed to repeat my results, do you mean everything worked like expected or did you face the same problems? I tried it again another other day and suddenly everything worked again, for whatever
    Posted to SPM Digest (Forum) by Polis Tyrol on Mon, May 13 2013
  • Re: How to use Point and Shoot Method to Calculate Modulus in Live Cells using the Catalyst

    Dear Mr. Berquand, I was just reading your comments on how to gather modulus values out of HSDC data. First, I want to mention that it must be explained better how to extract single force curves out of the HSDC data. I managed to do so now, but it took me quite a while. I tried hard to obtain force-separation curves from the HSDC data directly before
    Posted to SPM Digest (Forum) by Polis Tyrol on Thu, May 2 2013
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