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Up! Is there really no way to modify this? It is so frustrating not to have access to this option.
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Hello all, I'm using a Dimension 3100. We have version 5 and version 6 of the software. I want to do a scan with a high aspect ratio (e.g. 8µm*1µm) where the fast scan axis corresponds to the short length of the rectangle. Unfortunately, the program gives only the option of having the slow scan axis as the shortest axis. Is there any
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Sure. I can give an example. I made a 500nm*500nm scan of my crack. Without changing any other parameter, I change the scan size to 600nm. The scanned area is centered on the very same point. Then I change again to 700nm, and for some reason the scanned area is several tens of nanometers higher up in the Y-axis. As the crack height gets bigger for bigger
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Hello, I found out my problem. by increasing slowing the scan size with the slow direction (Y-axis) disabled, I noticed that the Y-position changes, hence a different height is measured. On a calibration grid I was obtaining always the right height for any scan size and any speed. So problem solved. Thank you anyways.
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Ok, I made an artificial line profile with matlab. The noise is of course not so high and the tip angle (or the step angle) is perhaps not so perfect, but it represents what I experienced.
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Hello, I exported one of the images of my scan in ASCII. This is it imported on Matlab, the blue line corresponds to the line profile located on the top right hand corner. The scan size is here 3840nm, but if I zoom in the step height changes. It's not a very good example because I have this deep indent in the middle so I certainly tuned the feedback
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Hello Dietmar, I'm sorry but I cannot use the AFM before some weeks and I didn't save any line profiles :s . I had the same problem by turning 90° the scan on other steps. Also the same height profile is showed in both directions, there is no visible hysteresis. What I did to characterize it was to look at only line profiles, disable the
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Hello all, I'm using a Dimension 3100 in taping mode with a common silicon probe. On my samples I can observe mode III cracks which produce a step. So basically, I'm imaging steps. My issue is that if I change the scan size from 512nm to 1024nm, the step height is doubled. And if I increase it to 2µm, it's again doubled, as if there