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Martin, On the nanoscope analysis, in the FV mode, you can type in your deflection sensitivity. For single force curve analysis, if you captured the force curve from a stiff substrate, you can update the deflection sensitivity. Can you check out some training videos here for more details about the software? https://www.bruker.com/service/education-training
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Alessandro, This should be in the help manual. Check it out from "Software User Guide --> File Formats" on your Nanoscope Software Help manual. If you can't find it, please contact the Bruker Tech Support in your region. Thanks, Teddy
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Hi Martin, I assume you're using DMT model and the absolute method for this measurement. This model is based on the contact mechanism between the tip and the sample. It is the Hertzian model with considering the adhesion force. The Hertzian model assumes "an elastic sphere of radius R indents an elastic half-space to depth d, and thus creates
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Please check it out here for many online webinars: https://www.bruker.com/service/education-training/training-courses/afm-optical-training-courses.html There is one about " Advanced Functions of Nanoscope Software" There are many detailed questions here. Addressing all these will need a very lengthy writing here. Please contact the Bruker
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This is an interesting question. I'd recommend you go with a new cell. I don't Bruker Tech Support would like you to perform such a non-standard fix. Maybe you should contact the Bruker Tech Support in your region to give it a try. Thanks, Teddy
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Would you be able to perform regular tapping mode using a regular probe, e.g. TESPA? This is to check the system is happy with tapping mode, including tapping piezo, probe slot, etc. For the "smart engage" issue, it only work when the probe can be successfully tuned. Please use standard engage. Please contact Bruker Tech Support in your region
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With such a large indentation depth, the Sneddon Model would be more accurate. In the Sneddon model, the half angle of the tip and the indentation depth are critical.
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It's likely due to the optical interference from the laser. Make sure the laser is on the right position of the cantilever. There is a very detailed trouble shooting guide about Noise on Image. Can you contact Bruker Tech Support and ask for "NBSB0133_Noise in Image_Nanoscope Troubleshooting Flow Chart" Thanks, Teddy
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Hi Jimmy, I can't see your picture. Can you contact Bruker Tech Support in your region? Thanks, Teddy
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Interesting question. Have your tried ImageJ? Let me also check with our software engineer. Thanks, Teddy