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Hi Luis, Thanks for the reply. Just for curiosity - the deflection error image is so much sharper and gives us a nice 'feel' of the surface features (as compared to height data). Why dont we then use it to (qualitatively) represent surface topography? Best - Palash
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Hello Everyone. What information can we extract from 'Deflection Error' image during contact mode AFM. I believe it represents the difference between tip deflection and peizo-movement. Thanks in Advance. Palash
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Dear All, I have read in many papers that performing PFM experiments on thin film samples using the Veeco di CP , Autoprobe (a quite old system by formerly known Veeco) is possible. I tried to contact Bruker experts but without much luck. If anyone can help me fix this issue I would be greatly indebted. I have access to the following instruments (as