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  • AFM & Optical Microscopy

    This datasheet describes the NEOS – a high resolution surface inspection microscope. NEOS combines AFM with a research grade upright optical microscope. Application Areas for the NEOS: Metallurgy Coatings (on metal, glass, etc.) Optical Industry (Glass, polymer for glasses and lenses) Fibers Micro...
    Posted to Brochures & Data Sheets by Andrea Thoene on Mon, Sep 19 2011
    Filed under: Brochure, DIC, defect inspection, upright optical microscope, dark field
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