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This datasheet describes the NEOS – a high resolution surface inspection microscope. NEOS combines AFM with a research grade upright optical microscope. Application Areas for the NEOS: Metallurgy Coatings (on metal, glass, etc.) Optical Industry (Glass, polymer for glasses and lenses) Fibers Micro...
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Posted to
Brochures & Data Sheets
by
Hector Lara
on Mon, May 2 2011
Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
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Brochure describing Bruker's BioScope Catalyst Perfusing Stage Incubator accessory.
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PeakForce QNM is a groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging...
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Posted to
Brochures & Data Sheets
by
Stephen Minne
on Wed, Dec 16 2009
Filed under: Brochure, Peak Force Tapping, 8.10, ScanAsyst, MultiMode 8, MultiMode, PeakForce QNM, TappingMode
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The best research instruments not only acquire the intended data, but actually increase productivity. Bruker’s BioScope Catalyst Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique...
Posted to
Brochures & Data Sheets
by
Stephen Minne
on Wed, Dec 16 2009
Filed under: Brochure, MIRO, BioScope, Catalyst, Peak Force Tapping, 8.10, ScanAsyst, PeakForce QNM, TappingMode
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination...