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  • Re: Sample roughness and appropriate probe...

    Dear Mariam, How stiff (ballpark) is your ceramic sample? When you say the roughness is 0.5-2um what is the scan size that gives you that roughness? If you want to measure the modulus of a stiff sample, you must use a stiff cantilever. Question 1 will allow you to look in the manual and find the recommended...
    Posted to SPM Digest by Bede Pittenger on Wed, Jun 12 2013
  • Re: Cantilever selection for measuring adhesion force

    You should choose a cantilever that is sensitive as possible, but does not cause the deflection measurement to saturate or become non-linear. The force is the spring constant times the deflection sensitivity times the detector voltage (F=K*Sd*V). If we know K for a given probe type and we know the approximate...
    Posted to SPM Digest by Bede Pittenger on Mon, Jun 10 2013
  • Proprietary High-Contrast Probe Tips on Innova-Iris AFM Enable First Complete Commercial TERS Solution

    Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes...
    Posted to Nanovations by Tracy Krainer on Thu, Apr 4 2013
  • Re: Do the tips ´OTESPA´ have the Al coating on the front side?

    No, there is no tip coating on OTESPA probes. The Al coating is backside only for better reflectivity. MESP or SCM-PIT probes are commonly used for KPFM. If you like the visible apex tip feature of the OTESPA probes, then you might also check out the OSCM-PT probes. Details for each can be found at Bruker...
    Posted to SPM Digest by Ben Ohler on Thu, Jul 5 2012
  • July 2011, Issue 2 - Bruker Probes' New Probes & New Site

    July 2011, Issue 02 NEW Dimension FastScan Broadband Probes - The Benchmark for AFM Speed Corresponding with Bruker's introduction of the world's fastest AFM, the Dimension FastScan™ , we have also released new Dimension FastScan Broadband Probes that are designed to maximize the system's...
    Posted to Nanovations on Wed, Jul 13 2011
  • Re: Surface Potential and Probes

    Hi Mithun, Having the EFM HOLDER AND SCM-PIT tips are enough for you to perform surface potential on Multimode; you do not need to apply voltage externally. Surface potential measurement has been done on organic solar cell (BHJ) and its component materials; make sure you electrically connect the underlying...
    Posted to SPM Digest by Chunzeng Li on Wed, Jun 29 2011
  • Re: Surface Potential and Probes

    Hi Sheila, The probe is critical for surface potential measurements, it is required to have a well defined work function and be robust. SCM-PIT probe from Bruker has a Pt-Ir coating which meets these criteria. Also Rocky Mountain Nanotech offers solid Pt probes (25Pt300B) which has the advantage that...
    Posted to SPM Digest by Chunzeng Li on Thu, Jun 2 2011
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