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  • AFM-Raman Solutions

    Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive...
    Posted to Brochures & Data Sheets on Wed, Jul 7 2010
    Filed under: Innova, BioScope Catalyst, Raman, AFM-Raman, IRIS, TERS
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