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Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive...
Posted to
Brochures & Data Sheets
on Wed, Jul 7 2010
Filed under: Innova, BioScope Catalyst, Raman, AFM-Raman, IRIS, TERS