Showing related tags and posts across the entire site.
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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
Posted to
NanoTheater
by
Thomas Mueller
on Mon, Feb 2 2015
Filed under: Video, Icon, Innova, AFM-Raman, Raman Spectroscopy, IRIS, TERS
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Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged...
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Bruker-axs.com | +1 805 967-1400 NANOVATIONS Newsletter Vol. 2 August 2012 Seeing at the Nanoscale 2012 Continued Innovation Delivers the Ultimate in AFM Technology As the world leader in AFM technology and manufacturing, Bruker takes its responsibility to support the industry with continual innovation...
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Posted to
Presentations
by
Thomas Mueller
on Fri, Feb 10 2012
Filed under: co-location, chemical identification, AFM-Raman, Raman Spectroscopy, TERS, crystallography
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Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition...
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Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks...
Posted to
Application Notes
by
Bruker
on Mon, Oct 24 2011
Filed under: AFM, AFM-Raman, Raman spectroscopy, Atomic Force Microscopy
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October 2011, Issue 03 Advancing TERS Research through the Combination of Industry-Leading Atomic Force Microscopy & Raman Spectroscopy Also available: inVia / Catalyst-IRIS combined system for transparent samples (transmission geometry). Please contact Bruker or Renishaw for further details. Researchers...
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Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive...
Posted to
Brochures & Data Sheets
on Wed, Jul 7 2010
Filed under: Innova, BioScope Catalyst, Raman, AFM-Raman, IRIS, TERS