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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions...
Posted to
Webinars and Video
by
Thomas Mueller
on Fri, Oct 12 2012
Filed under: Webinar, Webinar Slides, AFM, Quantitative Nanomechanical Mapping, solar cells, AFM webinar, PeakForce QNM, surface potential, PeakForce KPFM, KPFM, PFKPFM