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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions...
Posted to
Webinars and Video
by
Thomas Mueller
on Fri, Oct 12 2012
Filed under: Webinar, Webinar Slides, AFM, Quantitative Nanomechanical Mapping, solar cells, AFM webinar, PeakForce QNM, surface potential, PeakForce KPFM, KPFM, PFKPFM
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible...
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BILLERICA, Mass., Oct 07, 2010 (BUSINESS WIRE) -- Bruker Corporation (NASDAQ: BRKR) today announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. (NASDAQ: VECO) for $229.4 million in cash...
Posted to
News
on Wed, Oct 27 2010
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Atomic force microscopes (AFMs) are most often used for high-resolution imaging and detailed surface characterization, but soon after their invention it was recognized that they could also be used to change, interact with, and control nanoscale matter. A well-known early example of this was the IBM logo...
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Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at 65nm nodes and below. Measurement precision, and accuracy are foundational to the AFM including the added benefits of not being a direct, non-destructive technique that is not affected by feature material...
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Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins, probing the structure of single polysaccharide molecules, and monitoring the response of living cells to biochemical stimuli. All...
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. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the...
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The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications, routinely yielding useful data down to the thermal noise floor of the cantilever, typically about 10pN. This along with the ease with which it is applied to many biological systems has made it...
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