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AFM-Raman Solutions Brochure

Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged...

Posted to Brochures & Data Sheets by Tracy Krainer on Tue, May 14 2013
Filed under: Innova, AFM-Raman, AFM, Solutions
Proprietary High-Contrast Probe Tips on Innova-Iris AFM Enable First Complete Commercial TERS Solution

Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes...

Posted to Nanovations by Tracy Krainer on Thu, Apr 4 2013
TERS System for Material Science

Innova-IRIS AFM-Raman Research Platform.

Posted to Brochures & Data Sheets by Thomas Mueller on Tue, Nov 22 2011
Filed under: Innova, TappingMode, Raman, IRIS, AFM, Raman spectroscopy, TERS
Advanced Polymer Imaging with Innova

Posted to Application Notes by BrukerApplications on Mon, Jan 4 2010
Filed under: Innova, TappingMode, AFM, Nanoscale Characterization, Phase Imaging

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