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Innovation with Integrity Having touble viewing this email? Click here to view in your browser. Atomic Force Microscopy David Rossi Executive Vice President and General Manager Bruker's AFM Business Enabling AFM Advancement Bruker has always been committed to partnering with our customers to meet...
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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions...
Posted to
Webinars and Video
by
Thomas Mueller
on Fri, Oct 12 2012
Filed under: Webinar, Webinar Slides, AFM, Quantitative Nanomechanical Mapping, solar cells, AFM webinar, PeakForce QNM, surface potential, PeakForce KPFM, KPFM, PFKPFM