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Innovation with Integrity Continuing the Nanoelectrical Revolution April 2013 Bruker has a history of innovation and leadership in the area of semiconductor electrical characterization with industry-leading SSRM, SCM, CAFM, and TUNA application modules for Dimension® and MultiMode® and AFM platforms...
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Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy...
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Posted to
Brochures & Data Sheets
by
Hector Lara
on Mon, May 2 2011
Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
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All, Nice paper on high resolution MFM by Morgan et. al. in Nature Physics. Data taken using the MM and Dimension. Check it out at: http://www.nature.com/nphys/journal/v7/n1/full/nphys1853.html Steve
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The Dimension V AFM/Nanomechanical Tester from Veeco - Key Features and Operation Chris Orsulak from Veeco takes us for a tour of the Dimension V, which combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. The Dimension V is able...
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The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new...
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. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the...
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination...
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Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge transport properties of materials, and is of interest in the growing field of energy-related research. Conjugated polyelectrolytes (CPEs) are a particularly interesting class of materials, as they have...