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The Dimension FastScan ™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs Atomic Force Microscopy Webinar Series High Speed AFM Imaging: Bruker Dimension FastScan...
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on Thu, May 19 2011
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible...