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When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s (AFM’s) broad potential for nanoscale imaging and characterization of numerous physical surface properties has been somewhat offset by its slow imaging speed. Thus, the AFM has sometimes...
Posted to
Application Notes
by
Stephen Minne
on Fri, Jul 8 2011
Filed under: Peak Force Tapping, Application Note, Tapping Mode, Dimension FastScan, AN134, FastScan