The Nanoscale World

Browse Site by Tags

Showing related tags and posts across the entire site.
  • HarmoniXTM Microscopy for Materials Characterization

    By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy that extends these advantages even further, enabling higher resolution at higher speed while retaining the nondestructive, low-force qualities that make TappingMode AFM so popular. While contact mode force...
    Posted to Application Notes by Stephen Minne on Tue, Jul 6 2010
    Filed under: HarmoniX, Application Note, AN112
Page 1 of 1 (20 items)
Copyright (c) 2011 Bruker Instruments