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The calibration procedure is based on this paper by Ozgur: O. Sahin, "Harnessing Bifurcations in Tapping-Mode Atomic Force Microscopy to Calibrate Time-Varying Tip-Sample Force Measurements", Rev. Sci. Inst. 78 (2007) 103707. In addition there are a few tweaks to adjust for scaling factors...
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By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy that extends these advantages even further, enabling higher resolution at higher speed while retaining the nondestructive, low-force qualities that make TappingMode AFM so popular. While contact mode force...
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The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number...
Posted to
Application Notes
by
Bede Pittenger
on Thu, Apr 15 2010
Filed under: Dissipation, Stiffness, Adhesion, Peak Force, Phase, HarmoniX, TappingMode, Force Curve, Force Spectroscopy, 128, AN128, Peak Force Tapping, Peak Force QNM, QNM, Application Note
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The Dimension V AFM/Nanomechanical Tester from Veeco - Key Features and Operation Chris Orsulak from Veeco takes us for a tour of the Dimension V, which combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. The Dimension V is able...
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What is difference between Peak Force QNM and Harmonix mode in terms of the information you are getting?
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What is the speed gain of peakForce vs HarmoniX?
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How quantitative are modulus measurements?
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The offset tip used in HarmoniX should enhance the signal-to-noise ratio of the cantilever during tapping mode; since you went back to a more traditional probe do you create more noise in your measurements?
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HarmoniX registers peak force as well, can the HarmoniX software use peak force as the feedback paramater
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What can HarmoniX do but PeakForce QNM can not?
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HarmoniX Nanoscale Material Property Mapping mode with fluorescence microscopy is used to probe the surface characteristics of tissues isolated from the wheat grain. The resulting data provides new insights into this essential ingredient in human nutrition.
Posted to
Application Notes
by
SeanHand
on Tue, Dec 29 2009
Filed under: MIRO, Catalyst, Dissipation, Stiffness, Adhesion, Peak Force, Phase, HMX, NanoScope V, HarmoniX, Point and Shoot, HMX-S