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The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping...
Posted to
Other
by
Stephen Minne
on Thu, May 3 2012
Filed under: TappingMode, FastScan, Peak Force Tapping, Icon
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Posted to
Brochures & Data Sheets
by
Hector Lara
on Mon, May 2 2011
Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination...