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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
Posted to
NanoTheater
by
Thomas Mueller
on Mon, Feb 2 2015
Filed under: Video, Icon, Innova, AFM-Raman, Raman Spectroscopy, IRIS, TERS
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The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new...