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  • Bruker's AFM-Raman Solutions

    Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
    Posted to NanoTheater by Thomas Mueller on Mon, Feb 2 2015
    Filed under: Video, Icon, Innova, AFM-Raman, Raman Spectroscopy, IRIS, TERS
  • AFM-Raman and TERS - Webinar Slides

    Correlated Imaging & Latest TERS Advances
    Posted to Webinars and Video by Thomas Mueller on Thu, Oct 4 2012
    Filed under: Webinar Slides, AFM webinar, Raman, TERS, Innova, Icon, Catalyst
  • ECAFM Research Solution

    Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force microscopy (ECAFM) research. Available for Dimension Icon® and Dimension Edge™ AFMs, the cells have been designed for the widest solvent compatibility and ease of setup, even inside a glove box...
    Posted to Brochures & Data Sheets by Thomas Mueller on Tue, May 15 2012
    Filed under: Icon, battery, electrochemistry
  • Re: FastScan Atomic Resolution on Calcite: Large Sample Platform, Large Cantilever!

    I had a comment on another forum that I thought I would repeat here about our work with respect to that of Professor Frieder Mugele at Twente University. Professor Mugele has taken amazing atomic images and force curves on Gibbsite using the MultiMode. He and Dan Ebling have a paper in process, which...
    Posted to SPM Digest by Stephen Minne on Tue, May 1 2012
  • Dimension Icon Atomic Resolution with Mechanical Property Mapping

    An atomic resolution image of Calcite, this time taken on he Dimension Icon (90um scanner, large sample platform, SNL+ probe) showing the height and stiffness channels. (In the software, this is called Modulus, however, at the atom level, modulus is not defined since it is a continuum property. Here...
    Posted to Other by Stephen Minne on Tue, May 1 2012
    Filed under: Calcite, Peak Force Tapping, Dimension Icon, Icon
  • Re: PFQNM Force Curves: Parasitic Cantilever Motions

    Hi Lauren, I am not sure what eactly you refer to when you mention "parasitic cantilever motions". If you refer to the oscillations that occur after the tip leaves the surface that is a motion that is not really going to be removed. This motion is due to the energy stored being released. The...
    Posted to SPM Digest on Thu, Jun 23 2011
  • New Applications Note on ScanAsyst and PeakForce Tapping

    We just published a new Applications Note for download here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1548.aspx PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application...
    Posted to SPM Digest on Fri, May 6 2011
  • Nice new paper on Graphene using Dimension Icon

    Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy...
    Posted to SPM Digest by Stephen Minne on Wed, May 4 2011
  • Dimension FastScan Brochure

    Posted to Brochures & Data Sheets by Hector Lara on Mon, May 2 2011
    Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
  • Re: Electrical measurements on Heater Cooler

    Tim, You are correct in this. The quickest solution is to use the regular Icon tip holder (rather than the heated H/C tip holder) to do this measurement. The regular tip holder will enable the PFM, however, you will not be able to heat the tip. This should be no problem if your experiment is at less...
    Posted to SPM Digest by Stephen Minne on Wed, Nov 17 2010
  • Two new videos from AZnano: Catalyst and Icon

    Posted to News by Stephen Minne on Mon, Mar 8 2010
  • Dimension Icon Video, AZnano on YouTube

    The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new...
    Posted to NanoTheater by BrukerApplications on Mon, Mar 8 2010
    Filed under: Video, Dimension, Icon
  • Dimension Icon Brochure

    Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination...
    Posted to Brochures & Data Sheets by Stephen Minne on Wed, Dec 16 2009
    Filed under: Brochure, Dimension, Icon, Peak Force Tapping, 8.10, ScanAsyst, PeakForce QNM, TappingMode
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