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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
Posted to
NanoTheater
by
Thomas Mueller
on Mon, Feb 2 2015
Filed under: Video, Icon, Innova, AFM-Raman, Raman Spectroscopy, IRIS, TERS
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Correlated Imaging & Latest TERS Advances
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Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force microscopy (ECAFM) research. Available for Dimension Icon® and Dimension Edge™ AFMs, the cells have been designed for the widest solvent compatibility and ease of setup, even inside a glove box...
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I had a comment on another forum that I thought I would repeat here about our work with respect to that of Professor Frieder Mugele at Twente University. Professor Mugele has taken amazing atomic images and force curves on Gibbsite using the MultiMode. He and Dan Ebling have a paper in process, which...
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An atomic resolution image of Calcite, this time taken on he Dimension Icon (90um scanner, large sample platform, SNL+ probe) showing the height and stiffness channels. (In the software, this is called Modulus, however, at the atom level, modulus is not defined since it is a continuum property. Here...
Posted to
Other
by
Stephen Minne
on Tue, May 1 2012
Filed under: Calcite, Peak Force Tapping, Dimension Icon, Icon
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Hi Lauren, I am not sure what eactly you refer to when you mention "parasitic cantilever motions". If you refer to the oscillations that occur after the tip leaves the surface that is a motion that is not really going to be removed. This motion is due to the energy stored being released. The...
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We just published a new Applications Note for download here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1548.aspx PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application...
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Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy...
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Posted to
Brochures & Data Sheets
by
Hector Lara
on Mon, May 2 2011
Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
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Tim, You are correct in this. The quickest solution is to use the regular Icon tip holder (rather than the heated H/C tip holder) to do this measurement. The regular tip holder will enable the PFM, however, you will not be able to heat the tip. This should be no problem if your experiment is at less...
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The Veeco Dimension Icon Atomic Force Microscope Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres. Mickael also shows us through the software package and demonstrates a new...
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Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination...