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Overview of Bruker's solutions for collocated AFM-Raman imaging and TERS
Posted to
NanoTheater
by
Thomas Mueller
on Mon, Feb 2 2015
Filed under: Video, Icon, Innova, AFM-Raman, Raman Spectroscopy, IRIS, TERS
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Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged...
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The question came up again on how to read the *.flt files generated by the Dimension Edge and Innova. Here is a pdf explaining the data structure. Please note that the data are stored in "float" and NOT in "integer". Stefan Data Format.pdf
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Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes...
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Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in...
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Correlated Imaging & Latest TERS Advances
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Hi Evangelia, I assume that you are using the analog thermal box for your measurement. That box has been superceeded for quite some years by a newer software controlled version. Having said that, it always worked fine if one did not mind setting the resistance settings "by hand". I dropped...
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Hi, Yes there is a way. When you peform a lithography experiment selecting the "by depth" option, the system will turn the z-feedback off and raise the sample by the depth you specified. If you have tilt on your sample this can of course lead to errors in depth. In order to compensate for that...
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Latest brochure about our Innova research AFM platform. Updated to reflect latest v8 user interface, high resolution origami DNA images, and extensive accessories list including AFM-Raman option.
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Hi Saumil, That chip carrier that you pointed out allows you to bias the tip. With the regular carrier the tip is always grounded. In order to apply a bias (which the software always allows) you have to route the bias voltage to the sample. So if you can live with biasing the sample you don't need...
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Hi dmr42c, You may want to read up on elastic deformation and the St. Venant's law. As a simple rule of thumb you can assume that the tip deforms an area roughly 10x the diameter. So for a 5nm tip you will need a sample >50nm thick to be free from substrate effects. Best, Stefan
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If possible I use silver epoxi or similar, indium works too to achieve proper conductivity from sample to metal puck. If already mounted with tape you may try to paint some silver over the edges. The Innova has a slight offset in the Bias voltage so 0V may not be 0V. You may want to measure that in order...
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Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive...
Posted to
Brochures & Data Sheets
on Wed, Jul 7 2010
Filed under: Innova, BioScope Catalyst, Raman, AFM-Raman, IRIS, TERS
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