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  • Easy AFM: Atomic Force Microscopy made simple.

    . Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the...
    Posted to Application Notes by BrukerApplications on Mon, Jan 4 2010
    Filed under: Dimension, MultiMode, AFM, Cantilever, Tapping Mode
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