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  • SINGLE-WALLED CARBON NANOTUBE PROBES FOR AFM IMAGING

    This paper discusses fabrication and characterization of single-walled carbon nanotube (SWNT) AFM probes. By selectively deposit catalytic nanoparticles onto commercial AFM probes with silicon tips, we are able to grow SWNTs in the wafer scale, with 30-50% usable probe yield. We also discuss in detail...
    Posted to Brochures & Data Sheets by Stephen Minne on Thu, Apr 14 2011
    Filed under: nanotube, tips, Probe
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