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Atomic force microscopy (AFM) has been recognized since the mid-eighties [1] as an excellent technique to image a wide range of samples in their near-natural environment. Although the primary function of AFM is to generate three-dimensional (3D) profiles of the scanned surface, much more information...
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Publications
by
Thomas Mueller
on Thu, Feb 27 2014
Filed under: PeakForce KPFM, PeakForce QNM, ScanAsyst, Live Cells, Peak Force Tapping
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PeakForce Tapping is a Bruker exclusive AFM mode released in 2010 that is already featured in hundreds of peer reviewed publications. This post contains a list of all PeakForce Tapping publications in the BIBTEX format( http://en.wikipedia.org/wiki/BibTeX ). Peak Force Tapping makes possible nanoscale...
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Publications
by
Bede Pittenger
on Thu, Jan 30 2014
Filed under: PeakForce KPFM, PeakForce Tapping, PeakForce QNM, PeakForce TUNA, ScanAsyst
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2-page datasheet showcasing the unique benefits of PeakForce TUNA for obtaining the highest resolution conductivity data along with correlated nanomechanical information, on the most fragile samples, including OPVs, Lithium battery electrodes, and carbon nanotube structures.
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AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes: Conductive AFM (CAFM) , which covers the higher current range (sub-nA up to μA), and Tunneling...
Posted to
Application Notes
on Sat, Mar 12 2011
Filed under: Conductive AFM, PeakForce QNM, AFM Probes, PeakForce TUNA, Tunneling AFM, ScanAsyst
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Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes...
Posted to
Application Notes
on Sat, Mar 12 2011
Filed under: Conductive AFM, PeakForce QNM, AFM Probes, PeakForce TUNA, Tunneling AFM, ScanAsyst
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Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization on a wide range of samples. Traditionally, these measurements have been categorized into two classes...
Posted to
Application Notes
on Sat, Mar 12 2011
Filed under: Conductive AFM, PeakForce QNM, AFM Probes, PeakForce TUNA, Tunneling AFM, ScanAsyst
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Tony, I don’t think you should have any problem using these probes, and the operation should not change. A key feature of ScanAsyst is its exceptional force control when compared to other modes, and we have found that this force control enables much higher resolution when imaging because tip sharpness...
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For general purpose imaging we recommend ScanAsyst-AIR probes because their low spring constants and sharp tips provide the best high-resolution imaging on soft samples without damaging tips or samples. To enable quantitative modulus mapping, some deformation of the sample is necessary. For stiffer samples...
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What is the physical meaning for “Inphase”, “Quadrature” channels in ScanAsyst mode?
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What is the Z resonance?
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could it be used also for electrical (coulombian) forces, like in KPM?
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How best to optimize the scan rate for these new modes? How fast can they go?
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Is ScanAsyst a software? Any hardware changes with current tapping mode to use ScanAsyst?
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ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously...