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  • Re: Bipotetntiostat for an STM

    Isma, It depends on your STM system whether an external bipotentiostat would work to support all the functions, seemlessly. May I have the model of your STM and controller? Thanks Chunzeng Li Applications Scientist Nano Surfaces Division, Bruker
    Posted to SPM Digest by Chunzeng Li on Wed, Oct 31 2012
  • Re: Atomic resolution image of Si

    I'm not aware of one, but I did a quick search in Google Scholar and came up with the following. I do not have a copy, so let me know if it is useful or interesting. --Bede Nakagawa, Y. “Scanning Tunneling Microscopy of Silicon Surfaces in Air: Observation of Atomic Images.” Journal of...
    Posted to SPM Digest by Bede Pittenger on Mon, Apr 30 2012
  • Re: Dimension Icon STM tip keeps crashing

    Can you please check: use a volt-meter to check whether bias is present on the sample, with 1 probe on the sample, one probe on the piezo gaurd of the AFM head. It should read the same as bias set in the software. make sure STM tip is more than 1mm away from the surface. If the above does not solve the...
    Posted to SPM Digest by Chunzeng Li on Wed, Nov 2 2011
  • Re: STS curve using lock-in amplifier

    Dear Ki-Rak, Can you send me the manual for the Lock-in Amplifier you are using, I'd like to know what exactly are ADC1, ADC2, A, OSC Out. Here is my guess: ADC1 is to read in the modulated data, in this case, tunneling current. OSC Out is the AC drive signal, in this case, the dV. "A"...
    Posted to SPM Digest by Chunzeng Li on Fri, Jan 28 2011
  • Sharp STM tips

    How would one get or make STM tips with the following characteristics: -apex has 1 nm radius of curvature (or less) -opening angle (or cone angle) in the 5 nm above the apex is less than 60 degrees (full angle) -tip material is stable in air -can achieve atomic resolution
    Posted to SPM Digest on Thu, Jan 7 2010
  • Power supply for tip self-sputtering

    We are going to use a self-sputtering process to clean tungsten STM tips in situ using Ne gas and monitor the field emission threshold as a function of the sputtering time. This requires special high-voltage power supply, which is capable of outputting DC voltages of up to 1 kV with both polarities....
    Posted to SPM Digest on Thu, Jan 7 2010
  • Scanning Tunneling Microscopy: A Tool for Studying Self-Assembly and Model Systems for Molecular Devices

    The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling microscopy (STM) was soon recognized and culminated in the award of half the 1986 Nobel Prize in Physics...
    Posted to Application Notes by BrukerApplications on Mon, Jan 4 2010
    Filed under: MultiMode, Innova, STM, LUMO, NanoScope STM, HOMO, tunneling current
  • Electrical testing of soft delicate samples using Torsional Resonance Mode and TUNA

    Scanning tunneling microscopy (STM) employs a biased sharp metal probe in close proximity to a surface. When the tip-sample separation is small, there is a finite probability that electrons will tunnel across this gap. As the tip is scanned across the sample the tunneling current is utilized as a feedback...
    Posted to Application Notes by BrukerApplications on Mon, Jan 4 2010
    Filed under: TUNA, Torsional Resonance Mode, TR TUNA, Dielectric Film, TR-Mode, STM
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