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Isma, It depends on your STM system whether an external bipotentiostat would work to support all the functions, seemlessly. May I have the model of your STM and controller? Thanks Chunzeng Li Applications Scientist Nano Surfaces Division, Bruker
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I'm not aware of one, but I did a quick search in Google Scholar and came up with the following. I do not have a copy, so let me know if it is useful or interesting. --Bede Nakagawa, Y. “Scanning Tunneling Microscopy of Silicon Surfaces in Air: Observation of Atomic Images.” Journal of...
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Can you please check: use a volt-meter to check whether bias is present on the sample, with 1 probe on the sample, one probe on the piezo gaurd of the AFM head. It should read the same as bias set in the software. make sure STM tip is more than 1mm away from the surface. If the above does not solve the...
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Dear Ki-Rak, Can you send me the manual for the Lock-in Amplifier you are using, I'd like to know what exactly are ADC1, ADC2, A, OSC Out. Here is my guess: ADC1 is to read in the modulated data, in this case, tunneling current. OSC Out is the AC drive signal, in this case, the dV. "A"...
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How would one get or make STM tips with the following characteristics: -apex has 1 nm radius of curvature (or less) -opening angle (or cone angle) in the 5 nm above the apex is less than 60 degrees (full angle) -tip material is stable in air -can achieve atomic resolution
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We are going to use a self-sputtering process to clean tungsten STM tips in situ using Ne gas and monitor the field emission threshold as a function of the sputtering time. This requires special high-voltage power supply, which is capable of outputting DC voltages of up to 1 kV with both polarities....
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The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling microscopy (STM) was soon recognized and culminated in the award of half the 1986 Nobel Prize in Physics...
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Scanning tunneling microscopy (STM) employs a biased sharp metal probe in close proximity to a surface. When the tip-sample separation is small, there is a finite probability that electrons will tunnel across this gap. As the tip is scanned across the sample the tunneling current is utilized as a feedback...