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The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number...
Posted to
Application Notes
by
Bede Pittenger
on Thu, Apr 15 2010
Filed under: Dissipation, Stiffness, Adhesion, Peak Force, Phase, HarmoniX, TappingMode, Force Curve, Force Spectroscopy, 128, AN128, Peak Force Tapping, Peak Force QNM, QNM, Application Note
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The VITA module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution.