Showing related tags and posts across the entire site.
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The cycle averaging of Tapping limits performance because 1) the high resolution tip-sample interaction only occurs when the tip is close to the sample, and this is a fraction of the cycle, and 2) at low imaging forces, the effects of long range forces dominate the cycle. (This is also why atomic Tapping...
Posted to
Other
by
Stephen Minne
on Thu, May 3 2012
Filed under: TappingMode, FastScan, Peak Force Tapping, Icon
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HF Etched Mica. The video shows a Survey at 20um @ 4.8Hz, followed by a high resolution image at 4um @ 20Hz, followed by a video at 0.66um 55Hz. Hard flat samples are not that challenging for a high speed system because they don't challenge the z-actuator or slew rate (power) of the electronics.
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I was reading an AFM site and saw a contrived claim trying to make a comparison that was over 50% off the benchmark and thought it would be a good topic to open up for discussion. The comment was to the effect of: by scanning at a slower scan speed we are actually going faster because our poor scanner...
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DNA on Mica in Fluid (Prep by APS Method) Sample courtesy of Y. Lyubchenko, Univ. of Nebraska Med. Ctr 1 Second per image (2100 Frames were captured at 1 frame per second)
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Our new Dimension FastScan Atomic Force Microscope (the world's fastest AFM) will enable you to scan once and get all the details you need. Contact Bruker today to see for yourself the difference FastScan can make in your application. Find more info at www.bruker.com/fastscan
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Posted to
Brochures & Data Sheets
by
Hector Lara
on Mon, May 2 2011
Filed under: Brochure, Dimension, Icon, ScanAsyst, PeakForce QNM, TappingMode, High Speed Scanning, FastScan
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible...