From SPM Operation to Critical Dimension Atomic Force Microscopy, this poster is a perfect companion to any SPM workstation.
Posted to
Application Notes
on Fri, Jan 28 2011
Filed under: Conductive, TUNA, Tapping Mode, surface potential, Scanning Tunneling, Scanning Probe Microscopy Operation, Piezoresponse, Critical Dimension, LiftMode, Electrostatic Force, Magnetic Force, PeakForce Tapping, Contact Mode, Scanning Thermal, Scanning Capacitance, Scanning Spreading Resistance