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Hi!
I came accross two rather strange phenomenum today when I tried to image one of my sample using the MultiMode V AFM, using the J-scanner and the Nanoscope V controller (contact mode).
First, when the probe is scanning the surface, it seems that the z-piezo constantly extends, until eventually reaching the Z-limit (set to the maximum value of 4.7um). When this happens, it is necessary to re-engage the probe in order to keep scanning. I am wondering if anyone saw this effect, and how to overcome it. Please note that there is no drift on the vertical offset value, since the vertical offset remains the same after my probe is disengaged.
Secondly, it seems that my image gets stretched in the Y direction when scanning the image from the top of the frame to the bottom of the frame. This effect does not happen when imaging from the bottom frame to the top frame. I noticed that this phenomena is common when changing the X and Y offsets, but normally disappears after a minute or two. In my case, this effect is always present when scanning, even after the x and y-piezo have stabilized.
Is there a problem with my setup which is what I suspect?
Benoit
Hi Benoit,
I think you should give some more information.
Best regards,
Joop
Dear Joop,
Thank you for your reply.Here is more informations:
I am imaging in air, using the normal cell holder. The sample I am imaging consists of Aluminium oxide thin films. The room is temperature controlled at 21 degrees celcius. Concerning the J scanner, I don't think it is not a closed-loop scanner.
When imaging, my deflection setpoint is 0.2V (the vertical offset is set to 0 when the probe loses contact with the sample. The probe I am using is relatively soft (0.1N/m), and my deflection sensitivity is roughly 60mV/nm. The problem occurs whether the contact force is set low or high, although it seems worse when the deflection setpoint is high (high contact force).
Benoit.
Hello Benoit,
The settings are good then. It is in air so all the other remarks are useless Try measuring a calibration grid to see if the stretching is also there. If that is the case recalibrate, if its then still there I suspect something wrong with the piezo....
Best Regards,
Regarding your first point, I already experimented similar problem with a MM coupled to a NIII controller many years ago, never with a NV controller.
Regarding your second point, I agree with the suggestion: a calibration grid is the best test. The piezo might be damaged. You are right: when you change the x,y offset or the scan range, you can observe a few drift oevr a few scan lines but not more.
Good luck,
Alex.