The ability of atomic force microscopy (AFM) to create three-dimensional micrographs with nanometer resolution has made it an essential tool in applications ranging from semiconductor processing to biology. In addition to this topographical imaging, the AFM can also probe nanomechanical and other fundamental properties of sample surfaces, including their local adhesive or elastic (compliance) properties. Atomic force microscopy has become an important tool for nanoscale characterization, not only due to the resolution that can be achieved, but also because it can offer a broad suite of modes that address different sample properties.