Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of chemistry that augments the infrared approach to vibrational spectroscopy with higher resolution as well as the ability to interrogate nonpolar bonds and in situ systems in aqueous solutions. The advances in AFM and spectroscopy techniques are quite complementary to each other, not only because different information can be obtained from each technique, but also because the data acquired are interrelated in terms of spatial resolution. Bruker has combined the most advanced AFM and Raman techniques into leading performance systems for correlated imaging and Tip-Enhanced Raman Spectroscopy (TERS).
.