This Notebook is intended to be used as an introduction by the first-time user of Veeco Instruments
NanoScope Scanning Probe Microscopes (SPM). For further information, please consult the
Command Reference Manual and/or the appropriate NanoScope manual.
Specifically, this manual covers the following:
• History and Definitions in SPMs: Page 3
• Scanning Tunneling Microscope: Page 5
• Contact Mode AFM: Page 8
• TappingMode AFM: Page 10
• Non-contact Mode AFM: Page 11
• Advantages and Disadvantages of Contact Mode AFM, TappingMode AFM, and
Non-contact Mode AFM: Page 12
• Piezoelectric Scanners: How They Work: Page 14
• Piezoelectric Scanners: Hysteresis and Aging: Page 16
• Piezoelectric Scanners: Creep and Bow: Page 19
• Probes: Page 21
• Types of SPM Probes: Page 23
• Atomic Force Microscopy- “Beam Deflection” Detection: Page 25
• SPM Configurations: Page 26
• Abbreviated Instructions for Dimension Series AFMs: Page 29
• Abbreviated Instructions for the MultiMode AFM: Page 32
• Realtime Operation: Page 36
• Force Curves: Page 42
• Offline Operation: Page 44
• Tip Shape Issues: Page 53
• Typical Image Artifacts: Page 58
• Calibration: Page 62