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According to our software group, this problem arises when the color quality for the monitor is set to 'Medium' 16 bits. There is a check in the software that is done to make sure the screen device context is high quality (over 24 bits color). This is required to ensure the quality of the exports. The error message appears if the check is not
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As Ang Li says, the problem is that your deflection sensitivity is too high. This causes the force vs. separation plot to bend back so that it appears that the sample deformation decreases with increasing force. When the DMT model is applied to this data it results in a negative modulus. If you want to work with a qualitative measurement, you can just
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when you have Nanoscope Analysis running, press the 'F1' key, or click in the blue circle with question mark or look under the help menu and choose 'help...'. By online, I mean the one that is available from within the software. There is no manual that is posted on the internet (so far...). --Bede
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Hi Alan, Please look in the Nanoscope Analysis online manual for the Power Spectral Density (PSD) function. I think the "Power between cursors" is what you are looking for. --Bede
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Hi Dalia, While there is no need for rotated tips, I would stay away from the olympus probes for QNM, especially for the absolute calibration method. The reason is that the tapered design of teh cantilever and the way the tip is attached to it are more likely to flex and I don't think you can get a spring constant measurement for those probes without
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That is how I would do it. Please be sure to read the app note and the Sader paper for more details. If your purpose for finding the spring constant is to calibrate PFQNM, you may want to use the "Relative method". We have found it works better (especially for stiff probes), but you do need a reference material with known modulus. Imaging
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Those probes are a bit stiff for the thermal technique. I would suggest the "Sader Method" as an alternate option that might give more accurate results: http://www.ampc.ms.unimelb.edu.au/afm/calibration.html This document describes the options for spring constant calibration and the advantages and disadvantages of each: AN094-RevA0-Practical_Advice_on_the_Determination_of_Cantilever_Spring_Constants
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It will work with files back to 4.43. It will probably not work with 4.22 and earlier files. --Bede
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Apparently, NanoScope Analysis 1.40r1sr4 has a problem with paths that have non-english characters. I'll see about getting this fixed in the next version. Thanks Olga! --Bede
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Hi Mithun, To be clear, the point in providing those channels is to show where in an image material properties change, this can help identify components in a multicomponent system which may not be identifiable in the height signal, but do show up in Inphase and/or Quadrature (for example, in a polymer composite, you might know that 30% of the sample