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There is a good write up in the Nanolithography manual: 013-413-000 NANOMAN VS NANOLITHOGRAPHY page 48. From that section: Using a metal coated tapping tip, such as an SCM-PIT or MESP, engage on a clean, doped Si surface. Set the scan and feedback parameters to achieve a high quality image. Also see for other comments on oxidation: http://nanoscaleworld
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Thanks for reposting in the "Digest" section. All: This thread can be picked up here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/t/668.aspx Steve
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We are looking for a PHD, for a project with the title: Total ReplAcement of Meniscus with Minimally Invasive POLymer ImplaNt (TRAMMPOLIN) Attached is a pdf with more information, this information can also be found on www.bme-umcg.nl BMM_AIO_TRAMMPOLIN-1.pdf Contact email: p.k.sharma@med.umcg.nl I hope you can place this on the website under Jobs &
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As phrased, this is a bit of a difficult question. When you deflect the DMASP piezo, it will create a charge (not a voltage). The equations that relate the conjugate variables of cantilver: angle, deflection, piezo volume, and piezo charge to applied: bending moment, Uniform load (both usually 0 for SPM), Tip Load, and Piezo Voltage are well described
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Mithun, I checked with Mark and Alan in Support and they said you were in contact with them and now in good shape. . . Keep us posted, Steve
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By the probe in question, I suspect you are using TappingMode. I would perhaps approach your problem from a different direction and recommend you scan with Peak Force Tapping. We have found the PFT can image with considerably less tip damage and wear. This is a discussed a bit in this post: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums
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The ScanAsyst™ is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate
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TechSupport_Job Description_r0.pdf JOB TITLE: Technical Support Engineer DEPARTMENT: M&I Customer Support SUMMARY OF RESPONSIBILITIES: 1. Diagnostics and troubleshooting of Bruker Atomic Force Microscope / Optical Instrumentation applications and systems 2. Product training, installation, upgrade, and applications support 3. Front line customer
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To do this, you need to have the COM interface SW key. Contact me offline with your system information at steve.minne (at) bruker-nano.com.
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Umar, For what you describe I think Stefan’s recommendation is very good. You can interrupt the loop using the breakout box and inject your custom signals. You can also control the PI gains via NanoScript or COM through Matlab, Labview, or other (and even read the PSD signal), however, this communication may be too slow for what you are trying