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  • Re: Access levels

    Thanks for pointing this out Torbjorn! I will get this updated. In the mean time, please send your information to me, either through the site, or direct at steve.minne (at) bruker-nano.com. Thanks, Steve
    Posted to Off-Topic (Forum) by Stephen Minne on Thu, Jan 27 2011
  • Nanoscale Materials Characterization Symposium at the NSTI Nanotech meeting (Boston, June 2011)

    http://www.techconnectworld.com/Nanotech2011/sym/nanoscale_materials_characterization.html Nanoscale Characterization Flyer.pdf Hi, Could you please post the Nanoscale Materials Characterization Symposium at the NSTI Nanotech meeting (Boston, June 2011). Abstracts are being accepted until Jan. 28th; more info can be found in flyer and at (See attached
    Posted to Events (Forum) by Stephen Minne on Wed, Jan 26 2011
  • Re: STS curve using lock-in amplifier

    Ki-Rak Kim, It looks like the file you tried to upload remained on your hard drive. You first must upload the file to the NanoScale World, or make it a web link. Here are some instructions on how to do this: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/t/526.aspx (These instructions are for pictures, but they should work with pdf’s
    Posted to SPM Digest (Forum) by Stephen Minne on Mon, Jan 24 2011
  • Re: Measuring Scratch Depth

    Dave, First off I would download and use NanoScope Analysis, I think you will find that SW far superior. Instructions are here: Nanoscope Analysis v120r1sr3.pdf The get your data, I would use the ‘Rotating Box” feature of the section analysis. (Hold down shift to rotate). The Help file in NanoScope Analysis is extraordinary, so you can get
    Posted to SPM Digest (Forum) by Stephen Minne on Wed, Jan 19 2011
  • Re: force modulation

    Check out: Investigation of True Surface Morphology and Nanomechanical Properties of Poly(styrene-b-ethylene-co-butylene-b-styrene) Using Nanomechanical Mapping: Effects of Composition Dong Wang,* So Fujinami, Hao Liu, Ken Nakajima, and Toshio Nishi WPI Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577
    Posted to SPM Digest (Forum) by Stephen Minne on Mon, Jan 17 2011
  • Re: Lithography--on NanoScope IIIa

    Lue, Are you using Visual C++ 6.0? That is the compiler compatible with V5.30. If you are not using this version the Visual Studio project file might not be of the correct vintage. If you are, can you send me your complete system information (along with your location). I will pass this on to service, who can then check your CD image to make sure you
    Posted to SPM Digest (Forum) by Stephen Minne on Tue, Jan 11 2011
  • Re: Q on spring constants of stiff cantilevers

    Dalia, As you correctly state, the accuracy of the thermal-tune method decreases as cantilevers become stiffer. This happens because the thermal motion decreases (kz^2/2=kbT/2) with increasing k, to the point where the motion falls below the sensitivity of the detector. This obviously happens first in the regions with low response (off resonance) but
    Posted to SPM Digest (Forum) by Stephen Minne on Wed, Dec 22 2010
  • Re: Contact time in force measurements

    Catalina, You can get SW updates by emailing AFMSupport@bruker-nano.com with your system configuration. I already forwarded a copy of your request to them, and please follow up with your configuration. Best, Steve
    Posted to SPM Digest (Forum) by Stephen Minne on Mon, Dec 20 2010
  • Re: NanoScope IIIa software

    Istvan, Getting SW upgrades is a straight forward process. You simply need to contact Tech Support and they will give you a link and instructions. The WW listings for Support are here: http://www.bruker-axs.com/nano_surfaces_support.html In a separate email I will also connect you to John Tedesco so he can work with you direct. Best, Steve
    Posted to SPM Digest (Forum) by Stephen Minne on Mon, Dec 13 2010
  • Re: large area scan with AFM

    Scan size depends on your scanner. I can give you the spec if you post what you have, but yes, 100um is likely your limitation (unless you have a BioScope Catalyst, which you can do 150um in closed loop, and probably 200um in open loop). You don’t have to sacrifice lateral resolution. With NanoScopeV based systems you can record over 5000 x 5000
    Posted to SPM Digest (Forum) by Stephen Minne on Fri, Dec 3 2010
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